Hitachi FlexSEM1000 II

Hitachi FlexSEM1000 II


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Product Description

The FlexSEM 1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.

Specification

General Characteristic
Magnification

6x - 300,000x (on photo)

16x - 800,000x (on display)

Accelerating Voltage range 0.3 - 20 kV
Electron Source Pre-centered cartridge tungsten filame
Maximum sample size

80 mm (in diameter)
153 mm (in diameter)*


*option

SEM
Resolution

4.0 nm at 20 kV (SE; High Vacuum)

15.0 nm at 1 kV (SE, High Vacuum)

5.0 nm at 20 kV (BSE, Low Vacuum)

Image signal

Secondary electron (SE)

Backscattered electron (BSE)

Mix (BSE + SE)

UVD-CL*

STEM*


*option

Vacuum mode

6 - 100 Pa

Sample stage traverse

3-axis motorized stage

X : 0 - 50 mm

Y : 0 - 40 mm

Z : 5 - 33 mm

T : -15 - 90°

R : 360°

Maximum sample thickness

40 mm

Signal detector

SE detector

High sensitivity semiconductor BSE detector

Ultra Variable-pressure Detector (UVD)*


*option

Analysis system

Energy Dispersive X-ray Spectrometer (EDS)*

*option

Resources

Scanning Electron Microscope FlexSEM1000II.pdf

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