Hitachi FlexSEM1000 II
Product Description
The FlexSEM 1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.
Specification
| General Characteristic | |
|---|---|
| Magnification | 6x - 300,000x (on photo) 16x - 800,000x (on display) |
| Accelerating Voltage range | 0.3 - 20 kV |
| Electron Source | Pre-centered cartridge tungsten filame |
| Maximum sample size | 80 mm (in diameter) *option |
| SEM | |
| Resolution | 4.0 nm at 20 kV (SE; High Vacuum) 15.0 nm at 1 kV (SE, High Vacuum) 5.0 nm at 20 kV (BSE, Low Vacuum) |
| Image signal | Secondary electron (SE) Backscattered electron (BSE) Mix (BSE + SE) UVD-CL* STEM* *option |
| Vacuum mode | 6 - 100 Pa |
| Sample stage traverse | 3-axis motorized stage X : 0 - 50 mm Y : 0 - 40 mm Z : 5 - 33 mm T : -15 - 90° R : 360° |
| Maximum sample thickness | 40 mm |
| Signal detector | SE detector High sensitivity semiconductor BSE detector Ultra Variable-pressure Detector (UVD)* *option |
| Analysis system | Energy Dispersive X-ray Spectrometer (EDS)* *option |
Resources
| Scanning Electron Microscope FlexSEM1000II.pdf |
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