Multifunction Probe Microcopy Platform AFM100
Product Description
The AFM100 Series is Hitachi's next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, while providing an easy to use platform suitable for users of all experience levels.
Experience the finest reliability and innovation with the AFM1000 series.
Specification
| General Characteristic | |
|---|---|
| Sample Size | Max. 35 mmφ, thickness 10mm (max. 50mm sq., thickness 20mm)* |
| Detection System/Light Source | Optical lever/SLD (Super luminescent diode) |
| Lever holder | Premount holder, multi-holder |
| Basic Specifications | RMS noice level : ≦0.03 nm, in plate drift : ≦0.03 nm/sec |
| Scanner (Scan range) | (XY:20 μm/Z:1.5μm, XY:100 μm/Z:15 μm, XY:150 μm/Z:5 μm)*(Included with a 5 year warranty) |
| Light microscope | AFM100Plus Microscope with zoom function (Field of view XY:1.8 x 1.38 to 0.26x0.2 mm)* Simple optical microscope (Field of view XY:1.6 x 1.2 mm)* AFM100 Simple optical microscope (field of view XY:1.6 x 1.2 mm) |
| Basic functions | AFM100 Plus AFM, DFM, PM, FFM, SIS-shapes/properties, Q-value control AFM100 AFM, DFM, PM, FFM, SIS-shapes |
| Vibration isolation and noice isolation mechanism | AFM100 Plus Passive vibration isolation air table and sound-proof cover AFM100 Standard tabletop |
| Sample transfer mechanism | Manual Stage XY:±2.5 mm, Impact Stage Set (Conductive Type) |
| Other functions | Self-check function, software download service, AFM Making* |
| Measurement environment | Atmosphere, in liquid*, heated* (room temperature to 250 °C), heated in liquid* (room temperature to 60 °C) |
| Power Supply Specifications | AC 100 V ± 10 V, 15 A, 1 line, D inoculated grounded receptacle |
Resources
| Multifunctional Probe Microscopy Platform AFM100 series.pdf |
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