Our Principals
High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation. Hitachi FIB has various model: single beam system and multiple beam system. Hitachi FIB also completed with micro-sampling system for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample with an ion beam in the vacuum chamber of an FIB system.
Focused Ion & Electron Beam (FIB) Types
Real-time 3D analystical FIB-SEM NX9000
Focused Ion and Electron Beam System Ethox NX5000 Series
